Field emission from diamond particles studied by scanning field emission microscopyWATANABE, Akihiko; DEGUCHI, Masahiro; KITABATAKE, Makoto et al.Ultramicroscopy. 2003, Vol 95, Num 1-4, pp 145-151, issn 0304-3991, 7 p.Conference Paper

The decay of induced eddy currents in a two-dimensional electron systemJONES, C. L; USHER, A; ELLIOTT, M et al.Solid state communications. 1995, Vol 95, Num 7, pp 409-413, issn 0038-1098Article

Ionic conduction in anodic oxide films on titanium in mixed solutions of aqueous electrolytes and diethylene glycolKALRA, K. C; SINGH, K. C; MOHINDER SINGH et al.Thin solid films. 1994, Vol 239, Num 1, pp 99-103, issn 0040-6090Article

The influence of surface roughness on the capacitance between a sphere and a planeBOYER, L; HOUZE, F; TONCK, A et al.Journal of physics. D, Applied physics (Print). 1994, Vol 27, Num 7, pp 1504-1508, issn 0022-3727Article

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The effect of mound roughness on the electrical capacitance of a thin insulating filmPALASANTZAS, G; DE HOSSON, J. Th. M.Solid state communications. 2001, Vol 118, Num 4, pp 203-206, issn 0038-1098Article

Joint Symposium: 3rd International Symposium on Oxide Electronics and 1st Yamazaki International Symposium on Oxide Materials with Optoelectronic Functions, December 18-20, 1996, Tokyo, JapanKAWAZOE, Hiroshi; KOINUMA, Hideomi.Materials science & engineering. B, Solid-state materials for advanced technology. 1998, Vol 54, Num 1-2, issn 0921-5107, 138 p.Conference Proceedings

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International conference on materials for microelectronicsMaterials science and technology. 1995, Vol 11, Num 1, issn 0267-0836, 93 p.Conference Proceedings

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Proceedings of the 18th European Conference on Surface Science, Vienna, Austria, 21-24 September 1999SCHMID, Michael; LUNDGREN, Edwin; WERNER, Wolfgang et al.Surface science. 2000, Vol 454-56, issn 0039-6028, 1180 p.Conference Proceedings

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Broadening of the plasma resonance in metallic microcrystalsYATOM, H; RUPPIN, R.Physica status solidi. B. Basic research. 1992, Vol 174, Num 1, pp 37-43, issn 0370-1972Article

On transition emission on an inhomogeneous interfaceKOSHELEV, I. B; RYAZANOV, M. I.Laser physics. 2004, Vol 14, Num 6, pp 897-903, issn 1054-660X, 7 p.Article

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